Inhoudsopgave:
|
\u003cp\u003e\u003ci\u003eAdvances in Imaging and Electron Physics, Volume 216,\u003c/i\u003e merges two long-running serials, \u003ci\u003eAdvances in Electronics and Electron Physics and Advances in Optical \u003c/i\u003eand\u003ci\u003e Electron Microscopy\u003c/i\u003e. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.\u003c/p\u003e\u003cul\u003e\u003cli\u003eContains contributions from leading authorities on the subject matter\u003c/li\u003e\u003cli\u003eInforms and updates on the latest developments in the field of imaging and electron physics\u003c/li\u003e\u003cli\u003eProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource\u003c/li\u003e\u003c/ul\u003e |
nl
en
