VU Boekhandel

Scanning Electron Microscopy Physics of Image Formation and

Hoofdkenmerken

Auteur:	Reimer, Ludwig
Titel:	Scanning Electron Microscopy Physics of Image Formation and
Uitgever:	Springer-Verlag Berlin and
ISBN:	9783642083723
Serie:	Springer Series in Optical
Editie:	Softcover reprint of the original 2nd ed. 1998
Land van oorsprong:	Germany
Prijs:	€ 173.02
Verschijningsdatum:	01-12-2010
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Professional & Vocational
Categorie:	Spectrum analysis, spectrochemistry, mass spectrometry
Geillustreerd:	XIV, 529 p.
Dewey code:	502.825

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	529
Hoogte mm.:	161
Breedte mm.:	241
Dikte mm.:	33
Gewicht gr.:	844

Inhoud:

The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.