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Transmission Electron Microscopy Characterization of Nanomaterials

Hoofdkenmerken

Auteur:	Kumar, Challa S.S.R.
Redactie:	Kumar, Challa S.S.R.
Titel:	Transmission Electron Microscopy Characterization of Nanomaterials
Uitgever:	Springer-Verlag Berlin and
ISBN:	9783662524626
Editie:	Softcover reprint of the original 1st ed. 2014
Land van oorsprong:	Germany
Prijs:	€ 239.57
Verschijningsdatum:	23-08-2016
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Professional & Vocational
Categorie:	Materials science
Geillustreerd:	264 Illustrations, color; 138 Illustrations, black and white; IX, 717 p. 402 illus., 264 illus. in color.

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	717
Hoogte mm.:	235
Breedte mm.:	155

Inhoud:

Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.