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Atom-Probe Tomography The Local Electrode Atom Probe

Hoofdkenmerken

Auteur:	Miller, Michael K.; Forbes
Titel:	Atom-Probe Tomography The Local Electrode Atom Probe
Uitgever:	Springer-Verlag New York Inc.
ISBN:	9781489977908
Editie:	Softcover reprint of the original 1st ed. 2014
Land van oorsprong:	United States
Prijs:	€ 133,09
Verschijningsdatum:	17-09-2016
Bericht:	Langere levertijd (2-3 weken)

Inhoudelijke kenmerken

Leesniveau:	Professional & Vocational
Categorie:	Testing of materials
Geillustreerd:	33 Tables, color; 30 Tables, black and white; 62 Illustrations, color; 120 Illustrations, black and white; XVIII, 423 p. 182 illus., 62 illus. in color.

Technische kenmerken

Verschijningsvorm:	Paperback / softback
Paginas:	423
Hoogte mm.:	235
Breedte mm.:	155
Gewicht gr.:	908

Inhoud:

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy.